PROACTIVE Research Areas
Architectural-level and gate-level automatic test pattern generation (ATPG) Design verification and diagnosis Fault and defect coverage simulation Design for testability Test set compaction Architectural and High-level power issues VLSI gate-level power dissipation Computer architecture
Architectural-level and gate-level automatic test pattern generation (ATPG)
Design verification and diagnosis
Fault and defect coverage simulation
Design for testability
Test set compaction
Architectural and High-level power issues
VLSI gate-level power dissipation
Computer architecture
